JPS60262042A - 光電的仕事関数測定方法 - Google Patents
光電的仕事関数測定方法Info
- Publication number
- JPS60262042A JPS60262042A JP59118819A JP11881984A JPS60262042A JP S60262042 A JPS60262042 A JP S60262042A JP 59118819 A JP59118819 A JP 59118819A JP 11881984 A JP11881984 A JP 11881984A JP S60262042 A JPS60262042 A JP S60262042A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- work function
- energy
- anode
- photoelectric work
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
- G01N23/2273—Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59118819A JPS60262042A (ja) | 1984-06-09 | 1984-06-09 | 光電的仕事関数測定方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59118819A JPS60262042A (ja) | 1984-06-09 | 1984-06-09 | 光電的仕事関数測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60262042A true JPS60262042A (ja) | 1985-12-25 |
JPH0556459B2 JPH0556459B2 (en]) | 1993-08-19 |
Family
ID=14745921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59118819A Granted JPS60262042A (ja) | 1984-06-09 | 1984-06-09 | 光電的仕事関数測定方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60262042A (en]) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57161643A (en) * | 1981-03-31 | 1982-10-05 | Matsushita Electric Works Ltd | Measuring device for work function |
-
1984
- 1984-06-09 JP JP59118819A patent/JPS60262042A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57161643A (en) * | 1981-03-31 | 1982-10-05 | Matsushita Electric Works Ltd | Measuring device for work function |
Also Published As
Publication number | Publication date |
---|---|
JPH0556459B2 (en]) | 1993-08-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Fox et al. | Ionization in a mass spectrometer by monoenergetic electrons | |
Coates | The origins of afterpulses in photomultipliers | |
JPH0581168B2 (en]) | ||
Phillips et al. | Measurements of scintillation lifetimes | |
De Martini et al. | Photomultiplier Gate for Stimulated‐Spontaneous Light Scattering Discrimination | |
Marshall et al. | The Photomultiplier X‐Ray Detector | |
JPS60262042A (ja) | 光電的仕事関数測定方法 | |
Coates | A theory of afterpulse formation in photomultipliers and the prepulse height distribution | |
JPH0376841B2 (en]) | ||
JP2999127B2 (ja) | 極微領域表面の分析装置 | |
Egert et al. | A study of the electric field dependence of the photoinduced field emission current from tungsten | |
Eschard et al. | Signal to Noise and Collection Efficiency Measurements in Microchannel Wafer Image Intensifies | |
JP2001050916A (ja) | 仕事関数測定法および仕事関数測定装置 | |
Haeffler et al. | Fine structure of As− | |
JPS63102150A (ja) | イオン散乱分光顕微鏡 | |
JPH0437390B2 (en]) | ||
JPH0556460B2 (en]) | ||
JPH09211137A (ja) | 二重円筒形オープンカウンター | |
US3333100A (en) | Coating thickness measuring apparatus wherein a scanning electron beam produces characteristic x-rays detected by plural detectors | |
JP2509886B2 (ja) | 光電子放出閾値測定装置 | |
JPH0573190B2 (en]) | ||
Leskovar | The afterpulse time spectra of high-speed photon detectors | |
JPS63293847A (ja) | 半導体検査装置 | |
JPH0573189B2 (en]) | ||
GB2224352A (en) | Light waveform measuring apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |